Statistical Analysis of the Accuracy of Current-Mirror Structures Keywords: Current-Mirrors, Statistical Analysis, Analog VLSI circuits
نویسندگان
چکیده
| The accuracy of current mirrors in analog VLSI is reduced due to the reduction in the size. This paper describes a statistical approach for determining the accuracy of four commonly used current mirror structures, in the presence of process variations. Results indicate that with the same area limitation the simple twotransistor current mirror and the source degenerated current mirror have the least deviation. Other structures which are basically used to enhance the output conductance of the current mirror show a more deviation and also have an o set, while the simple structures. The geometrical parameters and threshold voltage have been used as the main factors varying in the process.
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